Understanding the Performance Gap between Polycrystalline and Single-Crystal Nickel-Rich Layered Oxide Cathodes

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Authors: Jing Wang, Jinghao Huang, Weiyuan Huang, Haozhe Zhang, Tao Zhou, Qijia Zhu, Jingtian Yang, Tianyi Li, Lu Ma, Xianghui Xiao, Zengqing Zhuo, Jihyeon Gim
+8 more Gangbin Yan, Xiaozhou Huang, Matthew Li, Rachid Amine, Jianguo Wen, Tongchao Liu, Ying Shirley Meng, Khalil Amine
Cited by: 12
References: 49

Abstract

Singe-crystal (SC) nickel-rich layered oxide cathodes, composed of boundary-free particles with high tap density, offer significant advantages in volumetric energy density and mechanical strength compared with polycrystalline (PC) cathode materials. However, as the nickel content increases (≥80%), SC Ni-rich cathodes often suffer from faster performance degradation than PC cathodes of the same composition, and the underlying causes of this discrepancy remain poorly understood. Herein, we reveal the distinct Ni redox behaviors that govern the electrochemical performance of SC and PC Ni-rich cathodes using multiscale and operando characterization techniques. Our results indicate that the increasingly heterogeneous Ni oxidation process in SC cathodes leads to the additional irreversible oxygen redox activity that deteriorates both the mechanical and chemical structures. In contrast, PC cathodes, despite with more pronounced surface reconstruction, exhibit greater chemomechanical stability due to homogeneous redox reactions during charging. Consequently, we find that bulk degradation, more than surface reactions, ultimately leads to fast capacity decay of SC Ni-rich cathodes during cycling. This work offers a comprehensive view on the impact of Ni redox evolutions on the chemomechanical stability in Ni-rich layered oxide cathodes, providing new insights into the longstanding performance gap between SC and PC cathodes, and guiding the rational design of Ni-rich cathode architectures.

Fields of Study & Subjects

Advancements in Battery Materials Advanced oxidation water treatment Gyrotron and Vacuum Electronics Research

Publication details

Journal / source
Journal of the American Chemical Society
Publisher
American Chemical Society (ACS)
Volume
148
Issue
9
Pages
9421–9432
Publication date
27 February 2026
Language
EN