Fast Interfacial Hole Consumption Suppresses Space–Charge Layer Trap Filling in BiVO 4 Photoanodes

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Authors: Longren Li, Tong Wang, Beier Hu, Louise I. Oldham, Q. Z. Chen, K Li, Chuxi Yang, Paransa Alimard, Zhu Meng, Haoqing Ning, James Robert Durrant, Andreas Kafizas
+1 more Artem A. Bakulin
Cited by: 1
References: 50

Abstract

High Resolution Image Download MS PowerPoint Slide Photoelectrochemical (PEC) oxidation of biomass-derived organics (e.g., glycerol) can outperform water oxidation while coproducing value-added chemicals. However, the kinetic basis of this enhanced performance, such as hole consumption dynamics and space–charge–layer (SCL) trap filling under PEC operating conditions, remains poorly understood. Using BiVO 4 as a model photoanode, we combine operando optical and photocurrent spectroscopies, including trap-selective pump-push photocurrent (PPPC) mapping, to track bulk and interfacial charge-carrier dynamics over the femtosecond-to-second (fs–s) time scale. Overall, we show that glycerol oxidation accelerates interfacial hole consumption, lowering the surface-hole density required to sustain a given photocurrent, thereby suppressing SCL trap filling and trap-mediated recombination. Glycerol increases the per-hole turnover frequency 32-fold (∼3.5 to ∼113.2 s –1 ) and the photocurrent density at 1.23 V RHE from ∼0.5 to ∼1.3 mA cm –2, while formic acid and dihydroxyacetone are the dominant quantified liquid products. Spatially resolved PPPC mapping (over ∼20 mm 2 ) shows that glycerol also suppresses localized trap-filled hot spots. Glycerol leaves the dominant early time bulk carrier dynamics largely unchanged while suppressing the microsecond buildup of trapped electrons in the SCL. These results highlight microsecond time-scale kinetic competition between interfacial hole consumption and SCL trap filling as a key design principle for PEC oxidation of renewable organics.

Fields of Study & Subjects

Advanced Photocatalysis Techniques TiO2 Photocatalysis and Solar Cells Electronic and Structural Properties of Oxides

Publication details

Journal / source
Journal of the American Chemical Society
Publisher
American Chemical Society (ACS)
Volume
148
Issue
25
Pages
26322–26332
Publication date
19 June 2026
Language
EN