Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields

Light Science & Applications 2026 Open access

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Authors: Bowen Wang, Qian Chen, Chao Zuo
DOI: 10.1038/s41377-025-02110-7
Cited by: 0
References: 35

Abstract

A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.

Fields of Study & Subjects

Near-Field Optical Microscopy Plasmonic and Surface Plasmon Research Nanowire Synthesis and Applications

Publication details

Journal / source
Light Science & Applications
Volume
15
Issue
1
Pages
40–40
Publication date
3 January 2026
Language
EN