Weak polarization electric field Ⅲ-N LEDs on polar plane with enhanced efficiency and strong lateral carrier confinement

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Authors: Jingkai Zhao, Changcai Zuo, Lidong Zhang, Haozhe Gao, Yuliang Liu, Gaoqiang Deng, Xiaohang Li, Yuantao Zhang
Cited by: 1
References: 63

Abstract

Weak polarization electric field (PEF) III-nitride LEDs provide a promising pathway toward high-performance micro-LEDs for next-generation displays and wearable devices. To realize this promise, improving the efficiency of weak-PEF LEDs is crucial, as it remains the central requirement for next-generation optoelectronic applications. Here, we demonstrate record-high efficiency weak-PEF LEDs on polar c-plane with InGaN/AlGaN digital alloy (DA) superlattice barriers, enabled by optimized pulse-growth mode of metal-organic chemical vapor deposition (MOCVD). In addition, we reveal strong lateral carrier confinement in these LEDs. We improve the structural quality and optical performance of weak-PEF InGaN/DA multiple quantum wells (MQWs) by optimizing the pulse-growth conditions. Further, we realize weak-PEF DA-based blue LEDs with peak external quantum efficiency up to 15%, which is the highest value in current studies of its kind. Importantly, weak-PEF DA-based LEDs have strong lateral carrier confinement, leading to less efficiency degradation from sidewall effects than conventional GaN-based MQWs LEDs. This work represents a meaningful step toward high-performance weak-PEF III-nitride LEDs, particularly for micro-LED applications where both efficiency and carrier confinement are critical.

Fields of Study & Subjects

GaN-based semiconductor devices and materials 2D Materials and Applications Optical Coatings and Gratings

Publication details

Journal / source
Light Science & Applications
Publisher
Springer Science and Business Media LLC
Volume
15
Issue
1
Publication date
1 July 2026
Language
EN