Pulsed-electron illumination does not reduce beam damage for imaging biological macromolecules

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Authors: Vishal Kumar, Julika Radecke, C. V., Inayathulla Mohammed, Ricardo Guerrero-Ferreira, Daniel Harder, Dimitrios Fotiadis, Henning Stahlberg
Cited by: 5
References: 32

Abstract

Abstract Radiation damage remains a fundamental limitation in cryo-electron microscopy (cryo-EM), constraining the total electron dose that can be used and thus limiting high-resolution imaging of biological specimens. Recent studies have proposed that temporally structured or pulsed electron beams could reduce radiation damage by allowing time for energy dissipation between individual electron interactions. To evaluate this hypothesis, we present a systematic investigation using a radiofrequency (RF) driven 300 kV Titan Krios microscope equipped with a cold field emission gun (c-FEG) to generate pulsed electron beams for specimens under cryogenic conditions. We compare radiation damage in three representative samples: paraffin 2D crystals, bacteriorhodopsin (purple membrane) 2D crystals, and plunge-frozen tobacco mosaic virus (TMV) in vitreous ice, under both pulsed and conventional ( = random) illumination, while keeping all other imaging conditions constant. Radiation damage is quantified by tracking the decay of computed diffraction intensities to determine the critical dose ( N e ). We observe no statistically significant difference in critical dose between pulsed and random illumination across all 3 samples. Our findings provide a critical reference point for future development and evaluation of temporally modulated electron sources in cryo-EM instrumentation.

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Photosynthetic Processes and Mechanisms Advanced X-ray Imaging Techniques

Publication details

Journal / source
Nature Communications
Publisher
Springer Science and Business Media LLC
Volume
17
Issue
1
Publication date
17 June 2026
Language
EN