Dichography: two-frame ultrafast imaging from a single diffraction pattern

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Authors: Linos Hecht, André Al Haddad, Björn Bastian, Thomas M. Baumann, Johan Bielecki, Christoph Bostedt, Subhendu De, A. De Fanis, Simon Dold, Thomas Fennel, Fanny Goy, Christina Gräf
+38 more Robert Hartmann, Georg Jakobs, M. Joschko, Gregor Knopp, Katharina Kolatzki, Sivarama Krishnan, Björn Kruse, Asbjørn Ø. Lægdsmand, Bruno Langbehn, S. Mandal, Tommaso Mazza, Michael H Meyer, Christian Peltz, Thomas Pfeifer, Safi Rafie-Zinedine, Antoine Sarracini, Mario Sauppe, Florian Schenk, Kirsten Schnorr, Björn Senfftleben, Keshav Sishodia, Frank Stienkemeier, Zhibin Sun, Rico Mayro P. Tanyag, Paul Tümmler, Sergey Usenko, Carl Frederic Ussling, Vanessa Wood, Xinhua Xie, Maksym Yarema, Olesya Yarema, Nuri A. Yazdani, Hankai Zhang, Bernd v. Issendorff, Yevheniy Ovcharenko, M. Mudrich, Daniela Rupp, Alessandro Colombo
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References: 72

Abstract

We experimentally demonstrate that pairs of time-delayed ultrabright and ultrashort X-ray pulses of two different colors, delivered by modern X-ray Free Electron Lasers, can provide two time-delayed snapshots of a sample. We introduce Dichography, a method that algorithmically separates the diffraction signals overlapping on the detector and independently retrieves the two images of the specimen. We employ Dichography to reconstruct two views of individual xenon-doped helium nanodroplets with 20 nm spatial resolution. The consistency of structures observed in both images at delays up to 750 fs provides evidence that, under these illumination conditions, significant structural damage only occurs at longer timescales. We further validate the method by imaging pairs of silver nanoparticles intercepted by the same light pulse. Dichography enables a new class of experiments across physics, chemistry, and materials science, making a significant step toward the original promise of X-ray free-electron lasers to capture ultrafast movies of nanomatter.

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Quantum superfluid helium dynamics Advanced Electron Microscopy Techniques and Applications

Publication details

Journal / source
Nature Communications
Publisher
Springer Science and Business Media LLC
Volume
17
Issue
1
Publication date
24 June 2026
Language
EN