Kinetic inductance of few-layer NbSe2 in the two-dimensional limit

Read full text
Authors: Sameia Zaman, Joel I-Jan Wang, Thomas Werkmeister, M. Tanaka, Thao Dinh, Max Hays, Daniel Rodan‐Legrain, Aranya Goswami, Réouven Assouly, Ahmet Kemal Demir, David K. Kim, Bethany M. Niedzielski
+10 more Kyle Serniak, Mollie E. Schwartz, Kenji Watanabe, Takashi Taniguchi, Philip Kim, Riccardo Comin, Jeffrey A. Grover, Terry P. Orlando, Pablo Jarillo‐Herrero, William D. Oliver
Cited by: 0
References: 78

Abstract

Abstract Van der Waals (vdW) superconductors remain superconducting down to the monolayer limit, enabling the exploration of emergent physical phenomena and functionality driven by reduced dimensionality. Here, we report the characterization of the kinetic inductance of atomically thin NbSe 2 , a two-dimensional van der Waals superconductor, using superconducting coplanar waveguides and microwave measurement techniques familiar to circuit quantum electrodynamics (cQED). The kinetic inductance scales inversely with the number of NbSe 2 layers, reaching 1.2 nH/ □ in the monolayer limit. Furthermore, the measured kinetic inductance exhibits a thickness-dependent crossover from clean- to dirty-limit behavior, with enhanced dirty-limit contributions emerging in the ultra-thin regime. These effects are likely driven by increased surface scattering, multi-band superconductivity, and geometric confinement. Additionally, the self-Kerr nonlinearity of the NbSe 2 films ranges from K/2π = −0.006 to −14.7 Hz/photon, indicating its strong potential in applications requiring compact, nearly linear, high-inductance superconducting quantum devices and detectors. The fabrication and characterization techniques demonstrated here are extensible to the investigation of other two-dimensional superconductors.

Fields of Study & Subjects

2D Materials and Applications Topological Materials and Phenomena Graphene research and applications

Publication details

Journal / source
Nature Communications
Publisher
Springer Science and Business Media LLC
Volume
17
Issue
1
Publication date
23 July 2026
Language
EN