Autonomous fabrication of tailored defect structures in 2D materials using machine learning-enabled scanning transmission electron microscopy

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Authors: Zijie Wu, Kevin M. Roccapriore, Ayana Ghosh, Kai Xiao, Raymond R. Unocic, Stephen Jesse, Rama Krishnan Vasudevan, Matthew G. Boebinger
Cited by: 1
References: 63

Abstract

Abstract Materials with tailored quantum properties can be engineered from atomic-scale assembly techniques, but existing methods often lack the agility and accuracy to precisely and intelligently control the manufacturing process. Here, we demonstrate a fully autonomous approach for fabricating atomic-level defects using electron beams in scanning transmission electron microscopy (STEM) that combines advanced machine learning and automated beam control. As a proof of concept, we achieved controlled fabrication of MoS-nanowire (MoS-NW) edge structures by iterative and targeted exposure of MoS 2 monolayer to a focused electron beam to selectively eject sulfur atoms, utilizing high-angle annular dark-field (HAADF) imaging for feedback-controlled monitoring of structural evolution of defects. A machine learning framework combining a random forest model and a convolutional neural network (CNN) was developed to decode the HAADF image and accurately identify atomic positions and species. This atomic-level information was then integrated into an autonomous decision-making platform, which applied predefined fabrication strategies to instruct beam control about atomic sites to be ejected. The selected sites were subsequently exposed to a localized electron beam using an FPGA-controlled scan routine with precise control over beam positioning and duration. While the MoS-NW edge structures produced exhibit promising mechanical and electronic properties 1–3 , the proposed methods to build the autonomous fabrication framework is material-agnostic and can be extended to other 2D materials for the creation of diverse defect structures and heterostructures beyond MoS 2 .

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Machine Learning in Materials Science Nanowire Synthesis and Applications

Publication details

Journal / source
npj Computational Materials
Publisher
Springer Science and Business Media LLC
Volume
12
Issue
1
Publication date
27 April 2026
Language
EN