TEM Agent: enhancing transmission electron microscopy with modern AI tools

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Authors: Morgan K. Wall, Alexander J. Pattison, Edward S. Barnard, Stephanie M. Ribet, Peter Ercius
Cited by: 3
References: 54

Abstract

Abstract Recent improvements in large language models (LLMs) have had a dramatic effect on capabilities and productivity across many disciplines involving critical thinking and writing. The development of the model context protocol (MCP) provides a way to extend the power of LLMs to a specific set of tasks or scientific equipment with help from curated tools and resources . Here, we describe a framework called designed for transmission electron microscopy (TEM) that leverages the benefits of LLMs through a MCP approach. We simultaneously access and control several subsystems of the TEM, a data management platform, and high-performance computing resources through text-based instructions. We demonstrate the abilities of the to set up and complete intricate workflows using a simplified set of MCP tools and resources accompanying a commercial LLM without any additional training. The use of a framework such as the simplifies access to complex microscope ecosystems comprised of several vendor and custom systems enhancing the ability of users to accomplish microscopy experiments across a range of difficulty levels.

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Machine Learning in Materials Science Scientific Computing and Data Management

Publication details

Journal / source
npj Computational Materials
Publisher
Springer Science and Business Media LLC
Volume
12
Issue
1
Publication date
10 June 2026
Language
EN