Wafer-scale monolayer dielectric integration on atomically thin semiconductors
Fields of Study & Subjects
Ferroelectric and Negative Capacitance Devices
2D Materials and Applications
Semiconductor materials and devices
Publication details
- Journal / source
- Nature Materials
- Publisher
- Springer Science and Business Media LLC
- Volume
- 25
- Issue
- 2
- Pages
- 199–206
- Publication date
- 12 January 2026
- Language
- EN