Detecting linear dichroism with atomic resolution

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Authors: Roger Guzman, Ján Rusz, Ang Li, Juan Carlos Idrobo, Wu Zhou, Jaume Gàzquez
Cited by: 1
References: 29

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Chemical and Physical Properties of Materials Electronic and Structural Properties of Oxides

Publication details

Journal / source
Nature Materials
Publisher
Springer Science and Business Media LLC
Publication date
12 May 2026
Language
EN