Limitations of probing field-induced response with STM

Nature 2026 Open access

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Authors: Christopher Candelora, Ilija Zeljković

DOI: 10.1038/s41586-026-10126-1

Cited by: 1

References: 8

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Integrated Circuits and Semiconductor Failure Analysis Near-Field Optical Microscopy

References 8