Integrated fluorescence light microscopy-guided cryo-focused ion beam-milling for in situ montage cryo-ET

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Authors: Jie Yang, Veronika Vrbovská, Joshua M. Mitchell, Tilman Franke, Bryan Sibert, Matt R Larson, Alexander S. Hall, Alex Rigort, Deane F. Mosher, John M. Mitchels, Elizabeth R. Wright
Cited by: 9
References: 77

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Advanced X-ray Imaging Techniques Electron and X-Ray Spectroscopy Techniques

Publication details

Journal / source
Nature Protocols
Publisher
Springer Science and Business Media LLC
Volume
21
Issue
6
Pages
2552–2587
Publication date
30 January 2026
Language
EN