Industrial reliability testing of transistor gate dielectrics

Nature Electronics 2026

View at publisher

Authors: Ernest Y. Wu, Tibor Grasser, Mario Lanza

DOI: 10.1038/s41928-026-01644-x

Cited by: 1

References: 57

Fields of Study & Subjects

Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design Ferroelectric and Negative Capacitance Devices

References 57