Magnetoresistance phenomena and measurement methodologies

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Authors: Changjiang Yi, Edouard Lesne, Stuart S. P. Parkin, Claudia Felser
Cited by: 1
References: 216

Fields of Study & Subjects

Magnetic Properties and Applications Non-Destructive Testing Techniques Magnetic properties of thin films

Publication details

Journal / source
Nature Reviews Methods Primers
Publisher
Springer Science and Business Media LLC
Volume
6
Issue
1
Publication date
2 April 2026
Language
EN