Expansion microscopy

Nature Reviews Methods Primers 2026

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Authors: Ha V. Vo, Rong 榕 Xu 徐, Ed Boyden, Yongxin Zhao

DOI: 10.1038/s43586-026-00480-9

Cited by: 1

References: 205

Fields of Study & Subjects

Near-Field Optical Microscopy Integrated Circuits and Semiconductor Failure Analysis Force Microscopy Techniques and Applications

References 205