A non-destructive UV Raman characterisation platform to enable insight into the mechanism of reversible ultraviolet-induced degradation (UVID) in TOPCon solar cells

Energy & Environmental Science 2026 Open access

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Authors: Pengfei Zhang, Caixia Li, Ziheng Liu, J. Huang, Jialin Cong, Jingwen Cao, Kun Yu, Jing Zhou, Liyan Miao, Jingming Zheng, Tingting Li, Jie Yang
+8 more Wusong Tao, Xinyu Zhang, Hao Jin, Minglei Sun, Jefferson Zhe Liu, Su‐Huai Wei, Martin A. Green, Xiaojing Hao
DOI: 10.1039/d5ee05078b
Cited by: 3
References: 34

Abstract

A non-destructive UV Raman characterisation platform is developed to reveal reversible changes at the materials level providing better understanding of the mechanism of reversible UVID in TOPCon solar cells.

Fields of Study & Subjects

Silicon and Solar Cell Technologies Thin-Film Transistor Technologies solar cell performance optimization

Publication details

Journal / source
Energy & Environmental Science
Publisher
Royal Society of Chemistry (RSC)
Volume
19
Issue
4
Pages
1148–1158
Publication date
1 January 2026
Language
EN