Nickel-oxide hole-transport layers prevent abrupt reverse-bias breakdown and permanent shorting of perovskite solar cells caused by pinhole defects

EES solar. 2026 Open access

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Authors: Daniel Morales, Collin Sindt, Kell Fremouw, Kaitian Mao, Matteo R. S. Poma, T. Stewart, Ryan A. DeCrescent, Michael D. McGehee
DOI: 10.1039/d5el00206k
Cited by: 4
References: 24

Abstract

30-nm-thick sputtered nickel oxide hole-transport layers decrease the likelihood of abrupt reverse-bias breakdown, permanent shorting, and severe thermal damage in perovskite solar cells.

Fields of Study & Subjects

Perovskite Materials and Applications Chemical and Physical Properties of Materials solar cell performance optimization

Publication details

Journal / source
EES solar.
Publisher
Royal Society of Chemistry (RSC)
Volume
2
Issue
2
Pages
323–329
Publication date
1 January 2026
Language
EN