Interlaboratory comparison of XRF analysis on thin films, including alloys, oxides, multilayers, and a lithium-ion battery material

Journal of Analytical Atomic Spectrometry 2026 Open access

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Authors: André Wählisch, C. Streeck, Yannick Philipp Stenzel, Sascha Nowak, Markus Osenberg, Ingo Manke, Michael Fartmann, Birgit Hagenhoff, Rainer Unterumsberger, Malte Wansleben, Lars Anklamm, Markus Krämer
+3 more Peter Gawlitza, Elena Blokhina, Burkhard Beckhoff
DOI: 10.1039/d5ja00460h
Cited by: 1
References: 36

Abstract

We report on a comprehensive, international interlaboratory comparison of thin film samples, including pure metals, stoichiometric oxides, multilayers, non-stoichiometric alloys, and a lithium-ion battery material.

Fields of Study & Subjects

X-ray Spectroscopy and Fluorescence Analysis Nuclear Physics and Applications Ion-surface interactions and analysis

Publication details

Journal / source
Journal of Analytical Atomic Spectrometry
Publisher
Royal Society of Chemistry (RSC)
Volume
41
Issue
5
Pages
1869–1882
Publication date
1 January 2026
Language
EN