Photo-induced force microscopy for nanometer surface characterization of functional interfaces

RSC Applied Interfaces 2026 Open access

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Authors: Maziar Jafari, Amir Khojastehnezhad, Mohamed Siaj
DOI: 10.1039/d5lf00346f
Cited by: 3
References: 223

Abstract

Practical applications of photo-induced force microscopy (PiFM) in the characterization of functional materials and interfaces with nanometer spatial resolution surface vibrational spectroscopy and imaging.

Fields of Study & Subjects

Force Microscopy Techniques and Applications Mechanical and Optical Resonators Near-Field Optical Microscopy

Publication details

Journal / source
RSC Applied Interfaces
Publisher
Royal Society of Chemistry (RSC)
Volume
3
Issue
2
Pages
266–292
Publication date
1 January 2026
Language
EN