Interplay of the interlayer distance and in-plane lattice relaxations in encapsulated twisted bilayers
Abstract
a single parameter characterizing the rigidity of encapsulation material interfaces. By analysing the twist-angle dependence of weak-to-strong lattice relaxation transition in twisted transition metal dichalcogenide bilayers, we show that increasing interface rigidity raises the crossover twist angle between the two relaxation regimes. Furthermore, tuning this rigidity parameter allows achieving good agreement with existing experimental results.
Fields of Study & Subjects
Advanced Materials and Mechanics
Surface Modification and Superhydrophobicity
Adhesion
Friction
and Surface Interactions
Publication details
- Journal / source
- Nanoscale
- Volume
- 18
- Issue
- 9
- Pages
- 4705–4711
- Publication date
- 1 January 2026
- Language
- EN