Decision letter for "In situ X-ray diffraction investigation of NiSx-formation on Ni-foam using chemical vapor deposition with H2S"

2026

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DOI: 10.1039/d5sc08479b/v2/decision1
Cited by: 0

Fields of Study & Subjects

Chalcogenide Semiconductor Thin Films Catalysis and Hydrodesulfurization Studies Electrocatalysts for Energy Conversion

Publication details

Publication date
29 January 2026