A multi-state spectroscopic approach to carrier dynamics in thin-film topological insulators

Journal of Materials Chemistry C 2026

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Authors: Xianting Zhang, Siyao Li, Che-Wei Huang, Jung-Chun Andrew Huang, Chih-Wei Luo, Chao-Kuei Lee, Hsiang‐Chen Chui
DOI: 10.1039/d5tc03686k
Cited by: 0
References: 42

Abstract

Understanding how to differentiate the dynamics of surface and bulk states is essential for advancing carrier physics in topological insulators.

Fields of Study & Subjects

Topological Materials and Phenomena 2D Materials and Applications Surface and Thin Film Phenomena

Publication details

Journal / source
Journal of Materials Chemistry C
Volume
14
Issue
14
Pages
5810–5817
Publication date
1 January 2026
Language
EN