Atomic force microscopy for ferroelectric materials research

Journal of Materials Chemistry C 2026 Open access

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Authors: Yeongyu Kim, Kunwoo Park, Seonggon Han, Dongyan Chen, Donghun Kim, Gumin Kang, Seungbum Hong
DOI: 10.1039/d5tc03998c
Cited by: 2
References: 118

Abstract

This review explores the role of AFM in bridging nanoscale domain physics and intrinsic properties. We highlight how multimodal characterization and active manipulation serve as essential strategies for studying ferroelectric materials.

Fields of Study & Subjects

Ferroelectric and Piezoelectric Materials Force Microscopy Techniques and Applications Ferroelectric and Negative Capacitance Devices

Publication details

Journal / source
Journal of Materials Chemistry C
Publisher
Royal Society of Chemistry (RSC)
Volume
14
Issue
8
Pages
2977–2991
Publication date
1 January 2026
Language
EN