In situ X-ray-based spectroscopy techniques for the characterization of solid–gas interfaces in nanostructures: what is next?
Abstract
In situ X-ray-based spectroscopy continues to evolve into more sophisticated experiments with future targets of very high spatial and temporal resolution.
Fields of Study & Subjects
X-ray Diffraction in Crystallography
X-ray Spectroscopy and Fluorescence Analysis
Advanced Chemical Physics Studies
Publication details
- Journal / source
- Physical Chemistry Chemical Physics
- Publisher
- Royal Society of Chemistry (RSC)
- Volume
- 28
- Issue
- 12
- Pages
- 7254–7265
- Publication date
- 1 January 2026
- Language
- EN