Local strain-engineering of exciton energy in 2D materials with nanoindentation
Abstract
enables controlled application of large, local strain fields. Far-field photoluminescence spectroscopy reveals exciton energy red shifts of up to 0.29 eV, corresponding to maximum strains of 2.7% in the indent center, assuming -0.109 eV shift per % strain. By varying the indent depth, we achieve control over the strain magnitude, and by changing the spherical tip radius, we scale the spatial extent of the strained region. Combined with the deterministic positioning capability of atomic force microscopy, this method provides a precise and versatile platform for studying strain-dependent phenomena in 2D materials.
Fields of Study & Subjects
2D Materials and Applications
Semiconductor Quantum Structures and Devices
Graphene research and applications
Publication details
- Journal / source
- Nanoscale
- Volume
- 18
- Issue
- 10
- Pages
- 5575–5587
- Publication date
- 1 January 2026
- Language
- EN