Enhancing high-temperature capacitive energy storage performance of BOPP films via constructing a dual-barrier structure

View at publisher
Authors: Tianyuan Yin, Bize Gong, Hai Sun, Chao Yin, Yue Zhang, Changhai Zhang, Tiandong Zhang
Cited by: 2
References: 35

Abstract

Experiments reveal the high-temperature failure mechanism of BOPP film. A double barrier structure was constructed to impede carrier injection into the dielectric. The energy storage density of the composite film is 365% that of BOPP film.

Fields of Study & Subjects

Dielectric materials and actuators Copper Interconnects and Reliability Ferroelectric and Piezoelectric Materials

Publication details

Journal / source
Journal of Materials Chemistry A
Publisher
Royal Society of Chemistry (RSC)
Volume
14
Issue
34
Pages
22250–22259
Publication date
1 January 2026
Language
EN