A High Temperature–Voltage Sensitivity 2‐Transistor Voltage Reference With Wide Range Operation

ABSTRACT Measurement of the temperature in an integrated circuit (IC) is essential for evaluating temperature‐dependent circuit performance. Using off‐chip temperature sensors for this purpose has limited accuracy in sensing the on‐chip temperature. For on‐chip integration with ICs, a low‐power and compact temperature sensor is required. Therefore, this letter presents a 2‐Transistor (2T) voltage reference generator (VRG) that overcomes the limited sensitivity of conventional structures through the deep‐subthreshold operation and achieves high – sensitivity by employing the narrow‐width effect. The proposed 2T VRGs are implemented in 28‐nm FD‐SOI process and demonstrated to operate over a temperature range of 200 to 400 K, achieving a 0.86 mV/K – sensitivity with 3.6% relative inaccuracy.