Anisotropic soft X-ray emission spectroscopy study of the valence electron state of Lu(Al,

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Authors: Yuki Hada, Yuda Hatakeyama, Yohei K. Sato, Masami Terauchi, Kaoru Kouzu, Shigeru Okada
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Abstract

Lu(Al,T)B4 (T= Cr, Mn, Fe, Mo) have the alternate stacking structure of B-layer and Lu(Al,T)-layer along the c-axis. B-K emission spectra of these materials are measured at two take-off angles of 20° and 70° from the c-plane. The energy region corresponding to the top of valence band (VB) shows a larger spectrum intensity at the smaller take-off angle, responsible for pz character. The bottom region shows the opposite angle dependence, responsible for px and py character. The middle of the VB of a large peak intensity shows almost no angle dependence, suggesting an isotropic distribution of bonding charge. As a whole, the angle-dependence of the B-K emission intensity is smaller than that of graphite. This rather isotropic bonding-charge distribution of the boron-layer can make the inter-layer bonding between B-layer and adjacent Lu(Al,T) layer and is presumably related to the hardness of those bulk materials.

Fields of Study & Subjects

X-ray Spectroscopy and Fluorescence Analysis Electron and X-Ray Spectroscopy Techniques Rare-earth and actinide compounds

Publication details

Journal / source
Springer Link (Chiba Institute of Technology)
Publication date
29 January 2026
Language
EN