Soft X-ray emission of nickel silicides and nickel aluminides

EPJ Web of Conferences 2026 Open access

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Authors: Xavier Llovet, Aurélien Moy, Jordi Ibàñez-Insa, Philippe Jonnard
DOI: 10.1051/epjconf/202634901010
Cited by: 0
References: 25

Abstract

Measurements are presented of the Si and Al L X-ray emission bands of Ni silicides (Ni 31 Si 12 and Ni 2 Si) and Ni aluminides (Ni 2 Al 3 and NiAl 3 ). The spectra, obtained with a soft X-ray spectrometer and electron beam excitation, reflect the distribution of Si and Al s - and d -states in the valence band. The experimental spectra are compared with X-ray emission spectra calculated from the local and partial densities of states obtained with density functional theory.

Fields of Study & Subjects

X-ray Spectroscopy and Fluorescence Analysis Electron and X-Ray Spectroscopy Techniques Semiconductor materials and interfaces

Publication details

Journal / source
EPJ Web of Conferences
Volume
349
Pages
01010–01010
Publication date
1 January 2026
Language
EN