Synthesis, and structural investigations of TiO2 doped Cr2O3 thin films for gas sensor applications

The most important details of the synthesis by using pulsed laser ablation in deionized water to ablate the Cr2O3 and TiO2 nanoparticles and drop-casting the solutions on the substrates to deposit Cr2O3 thin films with concentration ratio (0, 0.2, 0.4, 0.6, 0.8) % of TiO2 are illustrated. Additionally, a concise and precis explanation of the structural analysis included X-ray diffraction (XRD) and atomic force microscopy (AFM) and gas sensor performance evaluation were provided. (XRD) test revealed that all samples of Cr2O3:TiO2 films have a polycrystalline nature with Rhombohedral structure and the Cr2O3 is crystalized as a main plane in (012), while TiO2 nanoparticles have anatase phase with tetragonal crystal structure at plane (112). The gas sensor device of the heterojunction of Cr2O3:TiO2/Psi with concentration ratio (0, 0.2, 0.4, 0.6, 0.8) % of TiO2 were examined when exposed to 400ppm of NO2 gas at various temperatures (R.T, 100, 150) °C. The maximum value of sensitivity was 475.11% detected at 0.6% TiO2 at operation temperature of 100°C.