INR-TEM: Robust cavity detection in multifocus TEM images via implicit neural representations

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Authors: Chan-Min Hsu, Siyuan Xu, Lynch Mj, Yucheng Wang, Xingyu Liu, Conrad Williams, Xing Wang, Lijun Qian, Kevin G. Field, Xiaoning Qian
Cited by: 0
References: 18

Abstract

When characterizing materials using transmission electron microscopy (TEM) images, detecting and quantifying small features in microstructures, such as cavities, pose significant challenges. Off-the-shelf object detection models, including YOLOv8, show considerable performance degradation, particularly when images vary in resolution and the objects of interest possess a low percentage of the total image region of interest. In this study, we introduce a novel detection pipeline that incorporates an implicit neural representation (INR)-based detection method, INR-TEM, and two-modality imaging (e.g., under-focused and over-focused images typically acquired during materials characterization) to improve object detection performance. The INR-TEM method incorporates a pixel-wise prediction principle inspired by pixel-wise centerness weighting. INR-TEM demonstrates superior robustness to resolution variability, maintaining high detection accuracy even at low image resolutions compared to YOLOv8. To leverage INR-TEM effectively in real-world two-modality characterization applications, we further integrate a two-stage motion correction pipeline designed explicitly for aligning multifocus TEM images. The alignment process, comprising keypoint (based on scale-invariant feature transform, SIFT) and intensity matching, significantly mitigates the adverse effects of perceived motion-induced image degradation during through-focal TEM imaging, directly enhancing INR-TEM’s detection capability over conventional single-focus images. Our integrated INR-TEM cavity detection framework notably improves performance across various cavity sizes, outperforming off-the-shelf YOLOv8 detections that rely on a single image modality.

Fields of Study & Subjects

Advanced Neural Network Applications Advanced Electron Microscopy Techniques and Applications Image Processing Techniques and Applications

Publication details

Journal / source
APL Machine Learning
Volume
4
Issue
1
Publication date
10 February 2026
Language
EN