Shallow trap dynamics and non-thermal spectral shift in sub-10- μ m InGaN micro-LEDs
Abstract
Miniaturized InGaN micro-light-emitting diodes suffer reliability drifts that are not fully captured by conventional optical/electrical reporting. This study shows that, after 500-h direct current (DC) operation at 40 A cm−2, sub-10-μm devices exhibit a dominant-wavelength red-shift under fixed current that is non-thermal, as verified by
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Semiconductor Quantum Structures and Devices
Silicon Carbide Semiconductor Technologies
Publication details
- Journal / source
- Applied Physics Letters
- Publisher
- AIP Publishing
- Volume
- 128
- Issue
- 2
- Publication date
- 12 January 2026
- Language
- EN