Field evaporation of germanium under THz pulses: application to atom probe tomography

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Authors: Michella Karam, Matteo De Tullio, Jonathan Houard, Ivan D. Blum, Angela Vella
Cited by: 0
References: 46

Abstract

This study investigates the field evaporation behavior of germanium (Ge) under monocycle terahertz (THz) excitation using atom probe tomography (APT). The influence of THz pulse polarity, specimen geometry, and spectral content is systematically examined. Dual-polarity experiments reveal the coexistence of two emission mechanisms: field-driven and thermally assisted. Delayed evaporation features are observed, and their dependence on specimen geometry is analyzed using a nanowire heat diffusion model. The spectral filtering of the THz radiation further confirms the role of the pulse spectral content in shaping the thermal response of Ge samples. These findings identify key parameters governing THz-assisted APT of low-conductivity materials and provide guidelines for optimizing experimental conditions.

Fields of Study & Subjects

Advanced Materials Characterization Techniques Advanced Electron Microscopy Techniques and Applications Force Microscopy Techniques and Applications

Publication details

Journal / source
APL Materials
Volume
14
Issue
2
Pages
021103
Publication date
1 February 2026
Language
EN