Impact of cavity tuning on lasing characteristics for GaN-based vertical-cavity surface-emitting lasers

View at publisher
Authors: Naoki Shibahara, Shoki Arakawa, Atsunori Tokushi, Taiki Kitamura, Taichi Nishikawa, Ruka Watanabe, Satoshi Kamiyama, Motoaki Iwaya, Toshihiro Kamei, Tetsuya Takeuchi
Cited by: 1
References: 36

Abstract

We demonstrated that cavity tuning—i.e., the alignment of a resonance wavelength relative to a distributed Bragg reflector (DBR) center wavelength—is a key factor influencing the laser characteristics of GaN-based vertical-cavity surface-emitting lasers (VCSELs) with AlInN/GaN DBRs. By utilizing in-plane cavity tuning variation across our VCSEL wafer, the effective mirror loss was monotonically increased from 25 to 50 cm−1, resulting in corresponding changes in differential external quantum efficiency, threshold current density, and wall plug efficiency (WPE). The in-plane cavity tuning variation was effectively utilized to extract the internal parameters and identify an optimal mirror loss for high WPE in our GaN-based VCSELs. As a result, an internal loss of 11 ± 6 cm−1, an injection efficiency of 85% ± 10%, and an optimal mirror loss around 40 cm−1, achieving a WPE over 25%, were obtained.

Fields of Study & Subjects

Semiconductor Lasers and Optical Devices GaN-based semiconductor devices and materials Semiconductor Quantum Structures and Devices

Publication details

Journal / source
Applied Physics Letters
Publisher
AIP Publishing
Volume
128
Issue
17
Publication date
27 April 2026
Language
EN