Impact of Sintering Temperature on the Structure, Microstructure, Dielectric and Piezoelectric Properties of PSZT-PMS-PWN Ceramics Near Morphotropic Phase Boundary

The Pb4/5Sr1/5 (Z r11/20Ti9/20)O3-Pb(M n1/3Sb2/3)O3-Pb(W1/3Nb2/3)O3 (PSZ T-PM S-PWN) ceramics were prepared via the solid-state reaction method. The effect of sintering temperatures on PSZ T-PM S-PWN phase formation, microstructure and electrical properties were investigated. The X-ray diffraction study confirmed pure perovskite structure formation in the prepared ceramics and the coexistence of rhombohedral and tetragonal phases has been detected in all ceramics at room temperature. Scanning electron micrographs of fractured PSZ T-PM S-PWN ceramics revealed equiaxed grains and the presence of both transgranular and intergranular fracture modes. Optimal electrical properties were obtained at a sintering temperature of 1175oC, characterized by a high dielectric constant (ϵr=12735), a Curie temperature (TC) of 630 K, a dielectric loss (tanδ) of 0.03, a piezoelectric charge constant (d33) of 341 pC/N, an electromechanical coupling factor (KP) of 0.624, and a mechanical quality factor (Qm) of 1260. These properties indicate strong potential for applications in piezoelectric-related fields, especially under demanding or extreme conditions.