Effects of gamma irradiation and reliability of HfO 2 based RRAM devices
Fields of Study & Subjects
Radiation Effects in Electronics
Ferroelectric and Negative Capacitance Devices
Advanced Memory and Neural Computing
Publication details
- Journal / source
- Radiation effects and defects in solids
- Publisher
- Informa UK Limited
- Volume
- 181
- Issue
- 1-2
- Pages
- 142–151
- Publication date
- 2 January 2026
- Language
- EN