Crystal growth and structural control of C60 using mixing solvent by mist‐vapor deposition method

C60 thin films were prepared via the mist deposition method, a solution-based approach under atmospheric pressure, and their morphology, crystal structure, and molecular integrity were systematically investigated. Scanning electron microscopy (SEM) revealed that crystal morphology can be controlled by solvent composition and deposition temperature: pure mesitylene favored the formation of long needlelike crystals at lower temperatures, while the addition of 2-pyrrolidone shifted the optimal growth temperature and promoted the formation of cubic crystals. X-ray diffraction (XRD) confirmed the coexistence of face-centered cubic (fcc) and hexagonal close-packed (hcp) phases, with the relative fraction of the hcp phase increasing with higher 2-pyrrolidone content and deposition temperature. Fourier transform infrared spectroscopy (FT-IR) verified the preservation of the intrinsic C60 molecular framework, with minor signals from residual solvents. These findings demonstrate that the mist deposition method enables precise control over crystal size, shape, and phase composition while maintaining molecular integrity, providing a versatile and scalable route for fabricating high-quality fullerene thin films for electronic and optoelectronic applications.