Advanced synchrotron radiation techniques for multiscale characterization of fibrous microstructural architectures: methodologies and emerging applications

Abstract Synchrotron radiation (SR) technology serves as a core tool for the microstructural characterization of fibrous materials. Leveraging its high-resolution imaging and three-dimensional structural analysis capabilities, it enables in-situ and non-destructive characterization of microstructural information. Compared with laboratory light sources, SR sources boast a light intensity of up to 10 10 –10 14 photons, which is 6–8 orders of magnitude higher than that of laboratory sources. Their collimation is over 100 times better, and the spatial resolution reaches the nanometer level, capable of resolving the structures of nanoscale micropores, microcrystals, and interfaces, far exceeding the micrometer-submicrometer resolution level of laboratory light sources. This paper constructs a three-dimensional integrated framework that encompasses x-ray energy classification, technical type details, and targeted applications for fibrous materials. Based on the energy dimensions of soft x-rays, medium-energy x-rays, and hard x-rays, the suitable fibrous material characterization scenarios are identified. The principles, advantages, and application cases of scattering techniques, absorption fine-structure techniques, and imaging techniques are systematically integrated to achieve a precise connection between the technical system and material research. Combined with in-situ and non-destructive characterization examples of fibrous materials, this paper reveals the correlation mechanism between material structure evolution and performance, and looks forward to the development trends and application potential of SR technology, providing references for future research and technological advancements in this field.