Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope

Read full text
Authors: Yukinori Sakiyama, Santiago H. Andany, Georg Ernest Fantner, Joachim Heberle
Cited by: 1
References: 32

Abstract

Abstract Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular biology has been limited to static images in air. Recently, bottom illumination sSNOM (BI-sSNOM) was developed for operation in water. Yet, the scan rate of sSNOM remains a bottleneck to record protein structural changes in aqueous solution on the seconds time scale. We designed an optical and mechanical system consisting of a separate scan high-speed atomic force microscope (HS-AFM) coupled to the BI-sSNOM optics. The designed AFM scanner has a mechanical bandwidth of ca 70 kHz along the Z -axis, and ca 6 kHz along the XY -axis, equivalent to the sample scanning HS-AFM. The AFM performance is demonstrated by imaging actin filaments. The optical design is validated by sSNOM experiments on purple membranes and microtubules.

Fields of Study & Subjects

Near-Field Optical Microscopy Force Microscopy Techniques and Applications Molecular Junctions and Nanostructures

Publication details

Journal / source
Measurement Science and Technology
Publisher
IOP Publishing
Volume
37
Issue
4
Pages
047001–047001
Publication date
19 January 2026