Ultra-compact STM for high-precision nanoscale measurements in cryogenic and high magnetic fields

Measurement Science and Technology 2026

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Authors: Syed Asad Maqbool, Muhammad Touqeer, Behnam Esmaeilzadeh, Yang Shiwei, Wenjie Meng, Jihao Wang, Jing Zhang, Yubin Hou, Yalin Lu, Qingyou Lu
DOI: 10.1088/1361-6501/ae4131
Cited by: 1
References: 35

Abstract

Abstract We present an ultra-compact scanning tunneling microscope (STM) head with dimensions of 22.3 × 11.35 × 6.15 mm 3 . The design enables atomic-scale measurements under extreme conditions where space limitations, high mechanical stability, and thermal robustness are essential. It is specifically optimized for operation within narrow bores (

Fields of Study & Subjects

Surface and Thin Film Phenomena Force Microscopy Techniques and Applications Superconducting and THz Device Technology

Publication details

Journal / source
Measurement Science and Technology
Publisher
IOP Publishing
Volume
37
Issue
6
Pages
065902–065902
Publication date
3 February 2026