Circuit fault diagnosis method based on NEITD-IDBO-VME and hybrid neural network

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Authors: Xinmiao Lu, Jiashuai Sun, Qiong Wu, Kangji Wang, Yipin Wang, Luyu Jia
Cited by: 0
References: 27

Abstract

Abstract To address the challenges in modern circuit system fault diagnosis, including strong signal nonlinearity, significant noise interference, and poor stability, an intelligent diagnostic method based on noise-enhanced intrinsic time-scale decomposition (NEITD)-improved dung beetle optimizer (IDBO)-variational mode extraction (VME) and a hybrid neural network is proposed. The methodology comprises a dual-stage signal processing framework: first, the NEITD algorithm preprocesses raw fault signals through adaptive auxiliary signal enhancement and geometric filtering to improve noise immunity; second, the IDBO algorithm optimizes VME parameters to achieve adaptive decomposition of multiple IMF components. A multidimensional feature set integrating time-domain, frequency-domain, and nonlinear characteristics is subsequently constructed. Finally, a spiking-probabilistic hybrid neural network with attention mechanism enables high-precision fault classification. Experimental results demonstrate a diagnostic accuracy of 99.7%, significantly outperforming conventional methods and providing an effective solution for complex circuit system fault diagnosis.

Fields of Study & Subjects

Machine Fault Diagnosis Techniques Electrical Fault Detection and Protection VLSI and Analog Circuit Testing

Publication details

Journal / source
Measurement Science and Technology
Volume
37
Issue
10
Pages
105006–105006
Publication date
3 March 2026
Language
EN