Dynamic out-of-plane measurements using a speckle interferometer with a pixelated polarization camera

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Authors: Yanely B. Machuca-Bautista, Amalia Martínez-García, juan Rayas, Noel-Ivan Toto-Arellano, Jorge Aranda Flores, David Ignacio Serrano García, Yukitoshi Otani
Cited by: 2
References: 32

Abstract

Abstract This work presents a dynamic electronic speckle pattern interferometry system with out-of-plane sensitivity based on a pixelated polarization camera. The approach employs polarization-encoded phase-shifting interferometry, enabling the simultaneous acquisition of multiple phase-shifted speckle interferograms and allowing the temporal tracking of deformation fields induced by mechanical loading. From the four polarization-resolved interference patterns, the phase is retrieved using a Fourier-based phase demodulation approach, from which the out-of-plane displacement field is reconstructed. Experimental results obtained on galvanized steel plates, including samples with and without structural defects such as cracks, demonstrate the capability of the method to resolve spatial variations in dynamic deformation, which were introduced by a piezoelectric actuator to assess the temporal stability and repeatability of the proposed system. These results indicate that the proposed approach is suitable for non-destructive evaluation and dynamic deformation monitoring of metallic components under mechanical stress.

Fields of Study & Subjects

Optical measurement and interference techniques Structural Health Monitoring Techniques Digital Holography and Microscopy

Publication details

Journal / source
Measurement Science and Technology
Publisher
IOP Publishing
Volume
37
Issue
17
Pages
175004–175004
Publication date
25 March 2026