Computational investigations of impedance matching for pulsed capacitively coupled plasmas
Abstract
Abstract This numerical study investigates impedance matching strategies for pulsed capacitively coupled plasmas to address the challenge of realizing high-quality matching of time-dependent plasma impedances in pulsed discharges. We develop a self-consistent simulation framework that couples a kinetic particle-in-cell/Monte Carlo collisions plasma model with an external radio frequency matching circuit. The model evaluates three approaches: fixed set-point matching, ideal time-dependent capacitance tuning, and realistic rate-limited capacitor adjustment. The results demonstrate that due to the rapid change in plasma impedance during the pulse period, fixed set-point matching produces significant impedance mismatch and power reflection throughout the entire pulse discharge process, especially in the first few µ s when the voltage is switched on. Ideal time-dependent capacitance tuning reduces the reflection coefficient to values below 0.01 throughout the pulse cycle and suppresses reflected power to negligible levels ( < 0.01 % for average) across diverse conditions (duty cycles: 10 % –90 % , pulse frequencies: 2.5–10 kHz, pressures: 100–400 mTorr). For practical implementations, a capacitance change rate greater than 0.5 pF µ s −1 is required to keep the reflection coefficient < 0.04 and the average reflected power < 0.1 % . A linear scaling between the adjustment time ( τ lim ) of the matchbox capacitors and the average reflected power is revealed, with the average reflection coefficient following | Γ | ∝ τ lim . Our results provide design guidelines for time-dependent matching networks, highlighting that optimal performance necessitates capacitance adjustment rates aligned with plasma transition dynamics.
Fields of Study & Subjects
Plasma Diagnostics and Applications
Plasma and Flow Control in Aerodynamics
Electrostatic Discharge in Electronics
Publication details
- Journal / source
- Plasma Sources Science and Technology
- Volume
- 35
- Issue
- 2
- Pages
- 025006–025006
- Publication date
- 8 January 2026