Large-scale tests for the characterisation of the lpGBT stuck at power-up issue
Abstract
Abstract The Low-power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. In 2024, almost 270,000 lpGBTs v1 were tested with a production test system that exercises the entire ASIC functionality to ensure its correct operation. Furthermore, qualification tests (Total Ionizing Dose, Single-Event Upsets, etc.) were done on lpGBTs from each production lot. Despite the thorough production and qualification tests, a design issue named “stuck at power-up” was discovered, affecting a maximum of 0.9% of delivered devices simultaneously. The test system setup developed for the characterisation of this behaviour and the results obtained are presented here.
Fields of Study & Subjects
Particle Detector Development and Performance
Radiation Effects in Electronics
VLSI and Analog Circuit Testing
Publication details
- Journal / source
- Journal of Instrumentation
- Volume
- 21
- Issue
- 01
- Pages
- C01015–C01015
- Publication date
- 1 January 2026
- Language
- EN