Noise measurement in second harmonic generation with quasi-phase-matching device for electric poling quality evaluation

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Authors: Prashant Povel Dwivedi, Ajay Mishra, Nimish Dixit
Cited by: 0
References: 19

Abstract

Abstract The fabrication of quasi phase matching (QPM) device contains error in domain width. In the fabrication of QPM devices, one of the main contributors to this error in domain width is the electric poling process. This domain width error affects both the effectiveness of non—phase—matched parasitic processes and the effectiveness of frequency conversion, which frequently affects the performance of the QPM devices. In this paper, we proposed another method to evaluate the electric poling quality of QPM through second harmonic generation—noise intensity distribution, which is basically noise given the understanding of the error in the domain width in QPM. For measuring the error in domain width of a QPM device and offering a practical approach for evaluating the quality of the electric poling of a QPM device as good or poor.

Fields of Study & Subjects

Photorefractive and Nonlinear Optics Semiconductor Lasers and Optical Devices Solid State Laser Technologies

Publication details

Journal / source
Journal of Optics
Volume
28
Issue
5
Pages
055501–055501
Publication date
23 April 2026
Language
EN