Revisiting Correlated Evaporation Events in Atom Probe Tomography Data

Microscopy and Microanalysis 2026

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Authors: Daniel K Schreber, Nathan Bailey, Karen Kruska

DOI: 10.1093/mam/ozag053.059

Cited by: 1

References: 7

Fields of Study & Subjects

Advanced Materials Characterization Techniques Force Microscopy Techniques and Applications Advanced Electron Microscopy Techniques and Applications

References 7