Low-Dose TEM Imaging and Diffraction of a Beam-Sensitive 2D Polymer

Abstract Imaging extremely beam-sensitive materials using transmission electron microscopy (TEM) poses significant challenges due to rapid sample degradation under electron irradiation. This study demonstrates the application of the Gatan Metro® direct detection electron counting camera to acquire high-quality imaging and diffraction data under ultra-low electron dose rate conditions. A 2D polyimine thin film (2D-PI-BPDA), which degrades beyond 100e-/Ų at 300kV, served as the model system. The Metro camera’s superior sensitivity enabled both precise alignment to a zone-axis orientation and data collection within this dose budget, preserving structural integrity. These results highlight the role of advanced direct detection camera technology in expanding TEM capabilities for characterizing the pristine structure of highly beam-sensitive materials, such as 2D polymers, without compromising resolution.