Comparing contact resistance of edge-, top-, and hybrid-contacted two-dimensional materials

Physical Review Applied 2026 Open access

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Authors: Emeric Deylgat, Edward Chen, Bart Sorée, William G. Vandenberghe
DOI: 10.1103/ddpx-1tt4
Cited by: 0
References: 60

Abstract

sponsorship: This work has been supported by the Taiwan Semiconductor Manufacturing Company, Ltd. This work was supported by the Office of Naval Research (ONR) under Grant No. N00014-23-1-2020. (Taiwan Semiconductor Manufacturing Company, Ltd., Office of Naval Research (ONR)|N00014-23-1-2020)

Fields of Study & Subjects

2D Materials and Applications Graphene research and applications Advancements in Semiconductor Devices and Circuit Design

Publication details

Journal / source
Physical Review Applied
Volume
25
Issue
4
Publication date
11 March 2026
Language
EN