Metrology using atoms in an array of double-well potentials
Fields of Study & Subjects
Cold Atom Physics and Bose-Einstein Condensates
Force Microscopy Techniques and Applications
Advanced Materials Characterization Techniques
Publication details
- Journal / source
- Physical Review A
- Publisher
- American Physical Society (APS)
- Volume
- 113
- Issue
- 1
- Publication date
- 8 January 2026
- Language
- EN